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IEC 60749-38:2008 pdf download – Semiconductor devices – Mechanical and climatic test methods – Part 38: Soft error test method for semiconductor devices with memory

Posted on April 28, 2022 by admin

IEC 60749-38:2008 pdf download – Semiconductor devices – Mechanical and climatic test methods – Part 38: Soft error test method for semiconductor devices with memory 3Test apparatus 3.1Measurement equipment The […]