IEC 60749-37 pdf - Free IEC Standards Download

IEC 60749-37:2008 pdf download – Semiconductor devices – Mechanical and climatic test methods – Part 37: Board level drop test method using an accelerometer

Posted on April 28, 2022 by admin

IEC 60749-37:2008 pdf download – Semiconductor devices – Mechanical and climatic test methods – Part 37: Board level drop test method using an accelerometer 4 Test apparatus and components 4.1 […]