ISO IEC 10373-3:2010 pdf download – Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices
Scope
This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816. Each test method is cross-referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary International Standards that define the information storage technologies employed in identification card applications. NOTE Criteria for acceptability do not form part of this part of ISO/IEC 10373 but will be found in the International Standards mentioned above. This part of ISO/IEC 10373 defines test methods which are specific to integrated circuit technology with contacts.
ISO/IEC 10373-1 defines test methods which are common to one or more card technologies and other parts define other technology-specific tests. Test methods defined in this part of ISO/IEC 10373 are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially.
The test methods defined in this part of ISO/IEC 10373 are based on ISO/IEC 7816-3. Conformance of cards and IFDs determined using the test methods defined in this part of ISO/IEC 10373 does not preclude failures in the field. Reliability testing is outside the scope of this part of ISO/IEC 10373. This part of ISO/IEC 10373 does not define any test to establish the complete functioning of integrated circuit cards.
The test methods require only that the minimum functionality be verified. Minimum functionality is defined as follows. ⎯ Any integrated circuit present in the card continues to show an Answer to Reset response which conforms to the base standard. ⎯ Any contacts associated with any integrated circuit present in the card continue to show electrical resistance which conforms to the base standard.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
ISO/IEC 7810:2003, Identification cards — Physical characteristics ISO/IEC 7816-3:2006, Identification cards
— Integrated circuit cards — Part 3: Cards with contacts
— Electrical interface and transmission protocols
ISO/IEC 7816-4:2005, Identification cards — Integrated circuit cards — Part 4: Organization, security and commands for interchange
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
card
integrated circuit card with contacts as defined in ISO/IEC 7816
3.2
DUT
device under test
card or IFD that is subject to testing
3.3
etu-factor
parameters negotiable by protocol and parameters selection (PPS), described in ISO/IEC 7816-3:2006, 6.3.1
3.4
IFD
interface device related to integrated circuit cards with contacts as defined in ISO/IEC 7816-3
3.5
normal use
use as an identification card, as defined in ISO/IEC 7810:2003, 4.1, involving equipment processes appropriate to the card technology and storage as a personal document between equipment processes
3.6
test method
method for testing characteristics of identification cards and related interface devices for the purpose of confirming their compliance with International Standards
3.7
test scenario
defined typical protocol and application specific communication to be used with the test methods defined in this part of ISO/IEC 10373
3.8
typical protocol and application specific communication
communication between a DUT and the corresponding test-apparatus based on protocol and application implemented in the DUT and representing its normal use
4 General items applicable to the test methods
4.1 Test environment
Unless otherwise specified, testing of physical, electrical and logical characteristics shall take place in an environment of temperature 23 °C ± 3 °C, of relative humidity 40 % to 60 %.
4.2 Pre-conditioning
Where pre-conditioning is required by the test method, the identification cards to be tested shall be conditioned to the test environment for a period of 24 h before testing unless otherwise specified.
4.3 Selection of test methods
Tests shall be applied as required to test the attributes of the card defined by the relevant base standard (see 4.8).ISO IEC 10373-3 pdf download.
