IEC 62007-2:2009 pdf download - Semiconductor optoelectronic devices for fibre optic system applications – Part 2: Measuring methods

IEC 62007-2:2009 pdf download – Semiconductor optoelectronic devices for fibre optic system applications – Part 2: Measuring methods

IEC 62007-2:2009 pdf download – Semiconductor optoelectronic devices for fibre optic system applications – Part 2: Measuring methods
This part of lEC 62007 describes the measuring methods applicable to the semiconductoroptoelectronic devices to be used in the field of fibre optic digital communication systems andsubsystems.
All optical fibres and cables that are defined in lEC 60793 series,IEC 60794 series areapplicable. All optical connectors that are defined in lEC 60874 series are applicable,if apigtail is to be terminated with an optical connector.
2Normative references
The following referenced documents are indispensable for the application of this document.For dated references,only the edition cited applies. For undated references, the latest editionof the referenced document (including any amendments) applies.
lEC 60050-731:1991,International Electrotechnical Vocabulary – Chapter 731:Optical fibrecommunication
IEC 60793(all parts),Optical fibres
IEC 60794 (all parts),Optical fibre cables
IEC 60874(all parts),Connectors for optical fibres and cables
3 Terms, definitions and abbreviations
For the purposes of this document, the following terms, definitions and abbreviations apply.
3.1 Terms and definitions
3.1.1
PIN photodiode
photodiode with a large intrinsic region sandwiched between p- and n-doped semiconductingregions used for the detection of optical radiation
[IEV 731-06-29]
3.1.2
avalanche photodiode
photodiode operating with a bias voltage such that the primary photocurrent undergoesamplification by cumulative multiplication of charge carriers
[IEV 731-06-30]
3.1.3
pigtail
short optical fibre or optical fibre cable that is attached to a device being measured
3.2 Abbreviations
LED light emitting diodes
LD laser diode
PD photodiode
TIA transimpedance amplifier
APD avalanche photodiode
4 Measuring methods for photoemitters
4.1 Outline of the measuring methods
The LEDs and LDs have various opto-electronic properties. Some of them are important specifications for using them in the optical communication systems. The measuring methods for their opto-electronic properties are described in the following subclauses. Each subclause consists of following items.
a) Purpose
b) “Equipment setup” or “Circuit diagram” for measurement
c) “Equipment descriptions and requirements” or “Circuit descriptions and requirements”
d) Precautions to be observed
e) Measurement procedures
f) Specified conditions
4.2 Radiant power or forward current of LEDs and LDs with or without optical fibre pigtails
a) Purpose
To measure the radiant power Φ e or the forward current I F of light-emitting diodes (LED) and laser diodes, with or without optical fibre pigtails, under specified conditions.
b) Measuring equipment
Figure 1 shows an equipment setup for measuring radiant power and forward current of LEDs and LDs.
c) Equipment description and requirements
The radiation emitted by the device is submitted to multiple reflections from the walls of the integrating sphere; this leads to a uniform irradiance of the surface proportional to the emitted flux.A detector located in the walls of the sphere measures this irradiance.Anopaque screen shields the detector from the direct radiation of the device being measured.d) Precautions to be observed
The device being measured, the screen and the apertures shall be small compared to thesphere surface.
The inner surface of the sphere and screen shall have a diffusing coating having a highuniform reflection coefficient (0,8 minimum).
The sphere and detector assembly shall be calibrated.
Change in peak-emission wavelength and flux due to power dissipation shall be taken intoaccount.
When the device being measured is pulsed, the detector shall average the measuredradiation.
e) Measurement procedures
The emitting device is set at the entrance of the integrating sphere, so that no directradiation will reach the detector.
For measurement of radiant power, the specified forward current Ie is applied to the deviceand the radiant power is measured on the photodetector.
For measurement of forward current, a current is applied to the device until the specifiedradiant power (e) is achieved.The value of current is recorded.
f)Specified conditions
– Ambient or case temperature.
– Radiant power (when measuring forward current).-Forward current (when measuring radiant power).
4.3Small signal cut-off frequency (f.) of LEDs and LDs with or without optical fibre pigtails
a) Purpose
To measure the small-signal cut-off frequency (f. ) of light-emitting diodes (LED) and laserdiodes (LD) with or without optical fibre pigtaiis,under specified conditions.
b) Circuit diagram
Figure 2 shows a circuit diagram for measuring small-signal cut-off frequencyLEDs and LDs.

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